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* feat(electronics): add design and bench methodology * fix(electronics): retain compact diagnostic evidence * test(electronics): accept equivalent loading diagnostics
34 lines
672 B
Markdown
34 lines
672 B
Markdown
# Fault ledger
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Symptom, first observed:
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Known-good comparison:
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| Layer | Hypothesis | Predicted observation | Least-intrusive test | Mutation/safety effect | Result/next branch |
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| power | | | | | |
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| topology | | | | | |
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| electrical | | | | | |
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| timing/protocol | | | | | |
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| driver/application | | | | | |
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Missing artifact or measurement:
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Recovery state and owner:
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Firmware/wiring/instrument revisions:
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## Branch control
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What observation would contradict this hypothesis?
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What observation would merely be compatible?
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What artifact or measurement is missing?
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Mutation/rollback owner:
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Escalation after three non-converging tests:
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