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* feat(electronics): add design and bench methodology * fix(electronics): retain compact diagnostic evidence * test(electronics): accept equivalent loading diagnostics
44 lines
1.4 KiB
Markdown
44 lines
1.4 KiB
Markdown
# Sensor calibration plan
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## Device and signal chain
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- Exact sensor, revision, package/module, output class:
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- Stimulus/input units and engineering-output units:
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- Excitation, reference, conditioning, ADC, sample rate, and filters:
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- Installation, fixture, orientation, cable, and environmental limits:
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## Reference conditions
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- Standards and traceability:
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- Reference points and uncertainty:
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- Temperature, supply, warm-up, and stabilization:
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- Instrument IDs, ranges, resolution, and calibration status:
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## Procedure
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| Point | Applied reference (units) | Raw output (units) | Repeats | Temperature (units) | Supply (units) |
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|---|---:|---:|---:|---:|---:|
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| | | | | | |
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- Randomize or repeat order where drift could bias the fit:
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- Record warm-up, settling, overrange, disconnect, and recovery:
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- Preserve raw data and metadata before fitting:
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## Model and acceptance
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- Fit form and coefficient units:
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- Held-out validation points:
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- Residual, repeatability, hysteresis, drift, and noise limits:
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- Valid range and out-of-range behavior:
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- Coefficient storage, version, validity flag, and recalibration trigger:
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- Valid fit range in input/temperature units:
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- Invalid, disconnected, saturated, and out-of-range row:
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## Release evidence
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- Independent repeat and thermal/supply check:
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- Installation-specific verification:
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- Fault and diagnostic checks:
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- Raw-data path and report link:
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- Approver, date, and unresolved limitations:
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